Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira. Low-sensitivity to process variations aging sensor for automotive safety-critical applications. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 238-243, IEEE Computer Society, 2010. [doi]
Abstract is missing.