Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi. Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide. In 52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022. pages 368-371, IEEE, 2022. [doi]
@inproceedings{VecchiPP22-0,
title = {Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide},
author = {Sara Vecchi and Paolo Pavan and Francesco Maria Puglisi},
year = {2022},
doi = {10.1109/ESSDERC55479.2022.9947125},
url = {https://doi.org/10.1109/ESSDERC55479.2022.9947125},
researchr = {https://researchr.org/publication/VecchiPP22-0},
cites = {0},
citedby = {0},
pages = {368-371},
booktitle = {52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8497-8},
}