Andrea Vedaldi, Siddharth Mahendran, Stavros Tsogkas, Subhransu Maji, Ross B. Girshick, Juho Kannala, Esa Rahtu, Iasonas Kokkinos, Matthew B. Blaschko, David J. Weiss, Ben Taskar, Karen Simonyan, Naomi Saphra, Sammy Mohamed. Understanding Objects in Detail with Fine-Grained Attributes. In 2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014, Columbus, OH, USA, June 23-28, 2014. pages 3622-3629, IEEE, 2014. [doi]
Abstract is missing.