Ashok Veeraraghavan, Alex V. Genkin, Shiv Naga Prasad Vitaladevuni, Lou Scheffer, Shan Xu, Harald F. Hess, Richard Fetter, Marco Cantoni, Graham Knott, Dmitri B. Chklovskii. Increasing depth resolution of electron microscopy of neural circuits using sparse tomographic reconstruction. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 1767-1774, IEEE, 2010. [doi]
Abstract is missing.