Diana Vega, Ina Schieferdecker, George Din. Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3. In Alexandre Petrenko, Margus Veanes, Jan Tretmans, Wolfgang Grieskamp, editors, Testing of Software and Communicating Systems, 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007, Proceedings. Volume 4581 of Lecture Notes in Computer Science, pages 351-364, Springer, 2007. [doi]
Abstract is missing.