Maria Veizaga, Sophie Bercu, Claude Delpha, Demba Diallo, Ludovic Bertin. Classification of Voltage Sag Causes based on Instantaneous Symmetrical Components using 1NN and Dynamic Time Warping. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{VeizagaBDDB21, title = {Classification of Voltage Sag Causes based on Instantaneous Symmetrical Components using 1NN and Dynamic Time Warping}, author = {Maria Veizaga and Sophie Bercu and Claude Delpha and Demba Diallo and Ludovic Bertin}, year = {2021}, doi = {10.1109/IECON48115.2021.9589719}, url = {https://doi.org/10.1109/IECON48115.2021.9589719}, researchr = {https://researchr.org/publication/VeizagaBDDB21}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021}, publisher = {IEEE}, isbn = {978-1-6654-3554-3}, }