IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation

Antonio Velez-Estevez, Lorena GutiƩrrez-MadroƱal, Inmaculada Medina-Bulo. IoT-TEG 4.0: A New Approach 4.0 for Test Event Generation. IEEE Transactions on Reliability, 71(3):1368-1380, 2022. [doi]

Abstract

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