Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs. Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 58-63, IEEE Computer Society, 1999. [doi]
Abstract is missing.