Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

Singanallur Venkatakrishnan, Lawrence F. Drummy, Michael A. Jackson, Marc De Graef, Jeff Simmons, Charles A. Bouman. Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM). In IEEE Statistical Signal Processing Workshop, SSP 2012, Ann Arbor, MI, USA, August 5-8, 2012. pages 680-683, IEEE, 2012. [doi]

Authors

Singanallur Venkatakrishnan

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Lawrence F. Drummy

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Michael A. Jackson

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Marc De Graef

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Jeff Simmons

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Charles A. Bouman

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