Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

Singanallur Venkatakrishnan, Lawrence F. Drummy, Michael A. Jackson, Marc De Graef, Jeff Simmons, Charles A. Bouman. Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM). In IEEE Statistical Signal Processing Workshop, SSP 2012, Ann Arbor, MI, USA, August 5-8, 2012. pages 680-683, IEEE, 2012. [doi]

@inproceedings{VenkatakrishnanDJGSB12,
  title = {Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)},
  author = {Singanallur Venkatakrishnan and Lawrence F. Drummy and Michael A. Jackson and Marc De Graef and Jeff Simmons and Charles A. Bouman},
  year = {2012},
  doi = {10.1109/SSP.2012.6319793},
  url = {http://dx.doi.org/10.1109/SSP.2012.6319793},
  researchr = {https://researchr.org/publication/VenkatakrishnanDJGSB12},
  cites = {0},
  citedby = {0},
  pages = {680-683},
  booktitle = {IEEE Statistical Signal Processing Workshop, SSP 2012, Ann Arbor, MI, USA, August 5-8, 2012},
  publisher = {IEEE},
  isbn = {978-1-4673-0182-4},
}