A Technique for Logic Fault Diagnosis of Interconnect Open Defects - researchr publication

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Srikanth Venkataraman, Scott Brady Drummonds. A Technique for Logic Fault Diagnosis of Interconnect Open Defects. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 313-318, IEEE Computer Society, 2000. [doi]

Abstract is missing.

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