Srikanth Venkataraman, W. Kent Fuchs. Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 878-886, IEEE Computer Society, 1997.
@inproceedings{VenkataramanF97:1,
title = {Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing},
author = {Srikanth Venkataraman and W. Kent Fuchs},
year = {1997},
researchr = {https://researchr.org/publication/VenkataramanF97%3A1},
cites = {0},
citedby = {0},
pages = {878-886},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}