Dynamic diagnosis of sequential circuits based on stuck-at faults - researchr publication authors

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Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs. Dynamic diagnosis of sequential circuits based on stuck-at faults. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 198-203, IEEE Computer Society, 1996. [doi]

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