Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs. Dynamic diagnosis of sequential circuits based on stuck-at faults. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 198-203, IEEE Computer Society, 1996. [doi]
@inproceedings{VenkataramanHF96,
title = {Dynamic diagnosis of sequential circuits based on stuck-at faults},
author = {Srikanth Venkataraman and Ismed Hartanto and W. Kent Fuchs},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040198abs.htm},
tags = {rule-based},
researchr = {https://researchr.org/publication/VenkataramanHF96},
cites = {0},
citedby = {0},
pages = {198-203},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}