Muralidharan Venkatasubramanian, Vishwani D. Agrawal. A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation. In IEEE 23rd North Atlantic Test Workshop, NATW 2014, Johnson City, NY, USA, May 14-16, 2014. pages 57-60, IEEE, 2014. [doi]
Abstract is missing.