Radhika D. Venkatasubramanyam, Shrinath Gupta, Umesh Uppili. Assessing the Effectiveness of Static Analysis through Defect Correlation Analysis. In 2015 IEEE 10th International Conference on Global Software Engineering, ICGSE 2015, Ciudad Real, Spain, July 13-16, 2015. pages 100-104, IEEE, 2015. [doi]
Abstract is missing.