Vishak Venkatraman, Wayne Burleson. Robust Multi-Level Current-Mode On-Chip Interconnect Signaling in the Presence of Process Variations. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 522-527, IEEE Computer Society, 2005. [doi]
Abstract is missing.