On-chip signal level evaluation for mixed-signal ICs using digital window comparators

Daniela De Venuto, M. J. Ohletzo, Bruno Riccò. On-chip signal level evaluation for mixed-signal ICs using digital window comparators. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 68-72, IEEE Computer Society, 2001. [doi]

Authors

Daniela De Venuto

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M. J. Ohletzo

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Bruno Riccò

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