Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

Daniela De Venuto, Bruno Riccò. Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 311-316, IEEE Computer Society, 2007. [doi]

Authors

Daniela De Venuto

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Bruno Riccò

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