Daniela De Venuto, Bruno Riccò. Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 311-316, IEEE Computer Society, 2007. [doi]
@inproceedings{VenutoR07:0,
title = {Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays},
author = {Daniela De Venuto and Bruno Riccò},
year = {2007},
doi = {10.1109/ISQED.2007.90},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.90},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/VenutoR07%3A0},
cites = {0},
citedby = {0},
pages = {311-316},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}