Balancing test cost reduction vs. measurements accuracy at test time - researchr publication authors

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Matthieu Verdy, Dominique Morche, Emeric de Foucauld, Suzanne Lesecq, Jean-Pascal Mallet, Cedric Mayor. Balancing test cost reduction vs. measurements accuracy at test time. In IEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, Grenoble, France, June 7-10, 2015. pages 1-4, IEEE, 2015. [doi]

This author has not been identified. Look up 'Matthieu Verdy' in GoogleThis author has not been identified. Look up 'Dominique Morche' in GoogleThis author has not been identified. Look up 'Emeric de Foucauld' in GoogleThis author has not been identified. Look up 'Suzanne Lesecq' in GoogleThis author has not been identified. Look up 'Jean-Pascal Mallet' in GoogleThis author has not been identified. Look up 'Cedric Mayor' in Google

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