Matthieu Verdy, Dominique Morche, Emeric de Foucauld, Suzanne Lesecq, Jean-Pascal Mallet, Cedric Mayor. Balancing test cost reduction vs. measurements accuracy at test time. In IEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, Grenoble, France, June 7-10, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.