Richa Verma, Steven B. Bibyk. Signal Rate Activity as a Formal Method for Fault Discovery and Monitoring in Trusted and Secure Electronics Development. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 868-871, IEEE, 2019. [doi]
Abstract is missing.