Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique

Anjali Verma, Dinesh C. Dube. Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique. IEEE T. Instrumentation and Measurement, 54(5):2120-2123, 2005. [doi]

Authors

Anjali Verma

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Dinesh C. Dube

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