Anjali Verma, Dinesh C. Dube. Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique. IEEE T. Instrumentation and Measurement, 54(5):2120-2123, 2005. [doi]
@article{VermaD05,
title = {Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique},
author = {Anjali Verma and Dinesh C. Dube},
year = {2005},
doi = {10.1109/TIM.2005.854249},
url = {https://doi.org/10.1109/TIM.2005.854249},
researchr = {https://researchr.org/publication/VermaD05},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {5},
pages = {2120-2123},
}