Yashaswi Verma, C. V. Jawahar. A Robust Distance with Correlated Metric Learning for Multi-Instance Multi-Label Data. In Alan Hanjalic, Cees Snoek, Marcel Worring, Dick C. A. Bulterman, Benoit Huet, Aisling Kelliher, Yiannis Kompatsiaris, Jin Li 0001, editors, Proceedings of the 2016 ACM Conference on Multimedia Conference, MM 2016, Amsterdam, The Netherlands, October 15-19, 2016. pages 441-445, ACM, 2016. [doi]
Abstract is missing.