OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State

Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava. OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]

Authors

Rupali Verma

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Utpreksh Patbhaje

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Jeevesh Kumar

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Anand Kumar Rai

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Mayank Shrivastava

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