Frederik Vermeulen, Francky Catthoor, Hugo De Man, Diederik Verkest. Formalized Three-Layer System-Level Reuse Model and Methodology for Embedded Data-Dominated Applications. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 92-98, IEEE Computer Society, 2000. [doi]
Abstract is missing.