Elisa Verna, Gianfranco Genta, Maurizio Galetto, Fiorenzo Franceschini. Towards Zero Defect Manufacturing: probabilistic model for quality control effectiveness. In IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2021, Rome, Italy, June 7-9, 2021. pages 522-526, IEEE, 2021. [doi]
Abstract is missing.