Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications

Ionut Vernica, H. Wang, Frede Blaabjerg. Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications. Microelectronics Reliability, 88:1036-1041, 2018. [doi]

Authors

Ionut Vernica

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H. Wang

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Frede Blaabjerg

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