Ionut Vernica, H. Wang, Frede Blaabjerg. Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications. Microelectronics Reliability, 88:1036-1041, 2018. [doi]
@article{VernicaWB18,
title = {Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications},
author = {Ionut Vernica and H. Wang and Frede Blaabjerg},
year = {2018},
doi = {10.1016/j.microrel.2018.07.059},
url = {https://doi.org/10.1016/j.microrel.2018.07.059},
researchr = {https://researchr.org/publication/VernicaWB18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {1036-1041},
}