Benjamin Viale, Bruno Allard. Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part I. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3067-3080, 2020. [doi]
@article{VialeA20,
title = {Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part I},
author = {Benjamin Viale and Bruno Allard},
year = {2020},
doi = {10.1109/TCAD.2019.2962120},
url = {https://doi.org/10.1109/TCAD.2019.2962120},
researchr = {https://researchr.org/publication/VialeA20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {10},
pages = {3067-3080},
}