Benjamin Viale, Bruno Allard. Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part II. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3107-3117, 2020. [doi]
@article{VialeA20a,
title = {Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits - Part II},
author = {Benjamin Viale and Bruno Allard},
year = {2020},
doi = {10.1109/TCAD.2019.2962119},
url = {https://doi.org/10.1109/TCAD.2019.2962119},
researchr = {https://researchr.org/publication/VialeA20a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {10},
pages = {3107-3117},
}