Impact of Boundary Scan Design on Delay Test

E. Kofi Vida-Torku. Impact of Boundary Scan Design on Delay Test. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 96-105, IEEE Computer Society, 1992.

@inproceedings{Vida-Torku92,
  title = {Impact of Boundary Scan Design on Delay Test},
  author = {E. Kofi Vida-Torku},
  year = {1992},
  tags = {design science, testing, e-science, design},
  researchr = {https://researchr.org/publication/Vida-Torku92},
  cites = {0},
  citedby = {0},
  pages = {96-105},
  booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-0760-7},
}