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Quality level and fault coverage for multichip modules

E. Kofi Vida-Torku, Charles E. Radke. Quality level and fault coverage for multichip modules. In Charles E. Radke, editor, Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983. pages 201-206, ACM/IEEE, 1983. [doi]

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E. Kofi Vida-Torku

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Charles E. Radke

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