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Optimized alpha band patterns correlated with trait anxiety

Carmen Vidaurre, Vadim V. Nikulin, M. Herrojo Ruiz. Optimized alpha band patterns correlated with trait anxiety. In João Rafael Almeida, Alejandro Rodríguez González, LinLin Shen, Bridget Kane, Agma Traina, Paolo Soda, José Luís Oliveira, editors, 34th IEEE International Symposium on Computer-Based Medical Systems, CBMS 2021, Aveiro, Portugal, June 7-9, 2021. pages 450-454, IEEE, 2021. [doi]

Authors

Carmen Vidaurre

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Vadim V. Nikulin

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M. Herrojo Ruiz

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