Carmen Vidaurre, Vadim V. Nikulin, M. Herrojo Ruiz. Optimized alpha band patterns correlated with trait anxiety. In João Rafael Almeida, Alejandro Rodríguez González, LinLin Shen, Bridget Kane, Agma Traina, Paolo Soda, José Luís Oliveira, editors, 34th IEEE International Symposium on Computer-Based Medical Systems, CBMS 2021, Aveiro, Portugal, June 7-9, 2021. pages 450-454, IEEE, 2021. [doi]
@inproceedings{VidaurreNR21,
title = {Optimized alpha band patterns correlated with trait anxiety},
author = {Carmen Vidaurre and Vadim V. Nikulin and M. Herrojo Ruiz},
year = {2021},
doi = {10.1109/CBMS52027.2021.00051},
url = {https://doi.org/10.1109/CBMS52027.2021.00051},
researchr = {https://researchr.org/publication/VidaurreNR21},
cites = {0},
citedby = {0},
pages = {450-454},
booktitle = {34th IEEE International Symposium on Computer-Based Medical Systems, CBMS 2021, Aveiro, Portugal, June 7-9, 2021},
editor = {João Rafael Almeida and Alejandro Rodríguez González and LinLin Shen and Bridget Kane and Agma Traina and Paolo Soda and José Luís Oliveira},
publisher = {IEEE},
isbn = {978-1-6654-4121-6},
}