Andersson Calle Viera, Alexandre Berzati, Karine Heydemann. Fault Attacks Sensitivity of Public Parameters in the Dilithium Verification. In Shivam Bhasin, Thomas Roche, editors, Smart Card Research and Advanced Applications - 22nd International Conference, CARDIS 2023, Amsterdam, The Netherlands, November 14-16, 2023, Revised Selected Papers. Volume 14530 of Lecture Notes in Computer Science, pages 62-83, Springer, 2023. [doi]
Abstract is missing.