Embedded Power Delivery Decoupling in Small Form Factor Test Sockets

Omer Vikinski, Shaul Lupo, Gregory Sizikov, Chee Yee Chung. Embedded Power Delivery Decoupling in Small Form Factor Test Sockets. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-8, IEEE, 2008. [doi]

@inproceedings{VikinskiLSC08,
  title = {Embedded Power Delivery Decoupling in Small Form Factor Test Sockets},
  author = {Omer Vikinski and Shaul Lupo and Gregory Sizikov and Chee Yee Chung},
  year = {2008},
  doi = {10.1109/TEST.2008.4700569},
  url = {http://dx.doi.org/10.1109/TEST.2008.4700569},
  researchr = {https://researchr.org/publication/VikinskiLSC08},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008},
  editor = {Douglas Young and Nur A. Touba},
  publisher = {IEEE},
  isbn = {978-1-4244-2403-0},
}