Measuring to Fit: Virtual Tailoring Through Cluster Analysis and Classification

Herna L. Viktor, Eric Paquet, Hongyu Guo. Measuring to Fit: Virtual Tailoring Through Cluster Analysis and Classification. In Johannes Fürnkranz, Tobias Scheffer, Myra Spiliopoulou, editors, Knowledge Discovery in Databases: PKDD 2006, 10th European Conference on Principles and Practice of Knowledge Discovery in Databases, Berlin, Germany, September 18-22, 2006, Proceedings. Volume 4213 of Lecture Notes in Computer Science, pages 395-406, Springer, 2006. [doi]

Abstract

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