Analysis of fin height on FinFET SRAM cell hardening - researchr publication authors

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Hector Villacorta, Jaume Segura 0001, Sebastià A. Bota, Víctor H. Champac. Analysis of fin height on FinFET SRAM cell hardening. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 671-674, IEEE, 2014. [doi]

This author has not been identified. Look up 'Hector Villacorta' in GoogleThis author has not been identified. Look up 'Jaume Segura 0001' in GoogleThis author has not been identified. Look up 'Sebastià A. Bota' in GoogleThis author has not been identified. Look up 'Víctor H. Champac' in Google

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