Hector Villacorta, Jaume Segura 0001, Sebastià A. Bota, Víctor H. Champac. Analysis of fin height on FinFET SRAM cell hardening. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 671-674, IEEE, 2014. [doi]
Abstract is missing.