Hector Villacorta, Jaume Segura, Víctor H. Champac. Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability. J. Electronic Testing, 32(3):307-314, 2016. [doi]
@article{VillacortaSC16,
title = {Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability},
author = {Hector Villacorta and Jaume Segura and Víctor H. Champac},
year = {2016},
doi = {10.1007/s10836-016-5591-3},
url = {http://dx.doi.org/10.1007/s10836-016-5591-3},
researchr = {https://researchr.org/publication/VillacortaSC16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {3},
pages = {307-314},
}