Carlos Villarrubia, Eduardo Fernández-Medina, Mario Piattini. Analysis of ISO/IEC 17799: 2000 to be Used in Security Metrics. In Hamid R. Arabnia, Selim Aissi, Youngsong Mun, editors, Proceedings of the International Conference on Security and Management, SAM 04, June 21-24, 2004, Las Vegas, Nevada, USA. pages 109-117, CSREA Press, 2004.
Abstract is missing.