Avoiding Transients in Low-level Sensing of Secondary Electron Yield

Matthew Vincie, Tod Laurvick, Hengky Chandrahalim, Richard Cobb, James Sattler. Avoiding Transients in Low-level Sensing of Secondary Electron Yield. In 2020 IEEE Sensors, Rotterdam, The Netherlands, October 25-28, 2020. pages 1-4, IEEE, 2020. [doi]

Authors

Matthew Vincie

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Tod Laurvick

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Hengky Chandrahalim

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Richard Cobb

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James Sattler

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