Matthew Vincie, Tod Laurvick, Hengky Chandrahalim, Richard Cobb, James Sattler. Avoiding Transients in Low-level Sensing of Secondary Electron Yield. In 2020 IEEE Sensors, Rotterdam, The Netherlands, October 25-28, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{VincieLCCS20,
title = {Avoiding Transients in Low-level Sensing of Secondary Electron Yield},
author = {Matthew Vincie and Tod Laurvick and Hengky Chandrahalim and Richard Cobb and James Sattler},
year = {2020},
doi = {10.1109/SENSORS47125.2020.9278865},
url = {https://doi.org/10.1109/SENSORS47125.2020.9278865},
researchr = {https://researchr.org/publication/VincieLCCS20},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2020 IEEE Sensors, Rotterdam, The Netherlands, October 25-28, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6801-2},
}