Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks - researchr publication authors

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Kavita Vishwakarma, Rishabh Kishore, Suman Gora, Mandeep Jangra, Arnab Datta. Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]

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