An improved method for classification and metrological characterization of disturbances on QAM signals

Luca De Vito, Sergio Rapuano, Gioacchino Truglia. An improved method for classification and metrological characterization of disturbances on QAM signals. IEEE T. Instrumentation and Measurement, 55(1):26-34, 2006. [doi]

Abstract

Abstract is missing.