Mihai Vlase, Dan Munteanu, Adrian Istrate. Improvement of K-means Clustering Using Patents Metadata. In Petra Perner, editor, Machine Learning and Data Mining in Pattern Recognition - 8th International Conference, MLDM 2012, Berlin, Germany, July 13-20, 2012. Proceedings. Volume 7376 of Lecture Notes in Computer Science, pages 293-305, Springer, 2012. [doi]
Abstract is missing.