Investigating rare-event failure tolerance: reductions in future uncertainty - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jeffrey M. Voas, Frank Charron, Keith W. Miller. Investigating rare-event failure tolerance: reductions in future uncertainty. In 1st High-Assurance Systems Engineering Workshop (HASE 96), October 22, 1996, Niagara, Canada, Proceedings. pages 78-85, IEEE Computer Society, 1996. [doi]

This author has not been identified. Look up 'Jeffrey M. Voas' in GoogleThis author has not been identified. Look up 'Frank Charron' in GoogleThis author has not been identified. Look up 'Keith W. Miller' in Google

runs on WebDSL